Model

WT56N

020X009

WT56N

050X015

WT56N

055X015

WT56N 080x030

WT56N 200x060

WT56N 270x120

Reference distance（mm）

20

50

55

80

200

270

Mesurement

Z-axis（height）（mm）

±2.3

（F.S.=4.6）

±5

（F.S.=10）

±5

（F.S.=10）

±15

（F.S.=30）

±37

（F.S.=74）

±80

（F.S.=160）

X-axis（width）（mm）

Near side

8.5

15

15.3

27

51

94

Reference distance

8.7

15.7

15.9

30

60

120

Far side

8.7

15.7

15.9

30

60

120

Sampling frequency

Full frame

Up to 2300FPS

Profile data count

1024 items

Linearity

Z-axis（height）^*1

±0.1% F.S.

Repeatability^*2

Z-axis（height）（um）^*3

0.4

0.8

0.8

3

8

20

Resolution

Z-axis（height）（um）

0.15

0.3

0.3

0.9

2

5

Profile point interval

X-axis（width）（um）

8.5

15.4

15.5

29.5

59

118

Light source

Type

Blue semiconductor laser

Wavelength

405 nm

Data interface

Gigabit Ethernet

Temperature characteristics^*4

0.01% F.S./℃

Environmental resistance

Enclosure rating

IP67

Ambient temperature

0 to +50°C

Operating ambient humidity

20 to 85%（No condensation）

Vibration risistance

10 to 57 Hz, 1.5mm 0.06” double amplitude   in X, Y and Z directions，2   hours respectively

Impact resistance

15G / 6msec

Input voltage

+24 VDC ± 10%

Material

Aluminum

Weight

≈800g

≈800g

≈800g

≈810g

≈870g

≈930g

Size（mm）

175×98

×50

184×100

×50

184.5×90.5

×48

167x95

x57

184x95

x57

194x100

x57

*1: The measurement target is a standard block. The   contour data measured after 64 smoothing and 8 averaging.

*2: The data is an average of 4096 times taken on the   reference distance.

*3: The measurement target is a standard block. This   data is the average height measured in the initial setting area using the   height / position tool.

*4: This data is obtained by testing   aluminum alloy standard blocks in the measurement laboratory environment.